Products
SmartMarkTM SC
Superb index times, a wide common base, and the ability to provide increased flexibility and performance at lower cost combine to make the SmartMarkTM SC an innovative automation solution for either the back-end or assembly semiconductor market.
The SmartMarkTM SC offers a variety of options and configurations that can be customized...
View PDF for More Information |
Tapestry® SC
The MCT Tapestry® SC is a second-generation strip test handler that provides increased performance and greater flexibility at lower cost. The Tapestry® SC is essentially a universal test handler for all current and anticipated semiconductor device packages such as QFN, BGA, TSSOP, SOIC, QFP, CSP, etc. Tapestry® SC supports a wide variety of test strategies from...
View PDF for More Information |
SmartMarkTM
The MCT SmartMarkTM is an innovative laser marking and vision inspection system driven by electronic strip mapping. The system is capable of marking over-molded devices on laminated panels or lead frames. The SmartMarkTM is designed to function as a stand-alone system or can be integrated into an in-line process with other equipment...
View PDF for More Information |
SmartTrakTM Software Suite
The SmartTrakTM Software Suite incorporates Individual Tracking Capability (IDT) to bring the innovation of real-time visibility to your fingertips. By tracking machine performance and yield defect trends, SmartTrakTM provides your business with the information it needs to monitor production, solve field performance issues, and improve manufacturing performance.
View PDF for More Information |
SmartTrakTM IBIS
SmartTrakTM IBIS is an equipment wafer mapping system compatible with major die bond equipment. It is specifically designed to increase die bonder capacity, reduce overall probe and assembly cycle time, eliminate quality issues associated with the inking process step in order to reduce capital and operating spending.
View PDF for More Information |
Infinity SPC
Infinity SPC is an innovative software management tool for process and quality improvement with automatic measurement collection via a serial interface.
View PDF for More Information |
|